Name
Abstract | ||
|---|---|---|
In order to reduce the test cost, built-in self test (BIST) is widely used. One of the serious problems of BIST is that the compacted signature in BIST has very little information for fault diagnosis. Especially, it is difficult to determine which tests detect a fault. Therefore, it is important to develop an efficient fault diagnosis method by using incompletely identified pass/fail information. Where the incompletely identified pass/fail information means that a failing test block consists of at least one failing test and some passing tests, and all of the tests in passing test blocks are the passing test. In this paper, we propose a method to locate open faults by using incompletely identified pass/fail information. Experimental results for ISCAS'85 and ITC'99 benchmark circuits show that the number of candidate faults becomes less than 5 in many cases. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1093/ietisy/e91-d.3.661 | IEICE Transactions |
Keywords | Field | DocType |
compacted signature,open fault,built-in self test,fault diagnosis,open faults,incompletely identified pass,benchmark circuit,test block,test cost,efficient fault diagnosis method,fail information,candidate fault,pass | Pattern recognition,Computer science,Artificial intelligence,Self test,Electronic circuit,Computer engineering,Built-in self-test,Embedded system | Journal |
Volume | Issue | ISSN |
E91-D | 3 | 1745-1361 |
Citations | PageRank | References |
0 | 0.34 | 17 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Koji Yamazaki | 1 | 27 | 8.41 |
| Yuzo Takamatsu | 2 | 150 | 27.40 |