Year | Venue | Keywords |
---|---|---|
2005 | European Test Symposium | embedded systems,chip,system on chip,automatic test equipment,scalability,frequency,space technology |
DocType | Citations | PageRank |
Conference | 2 | 0.45 |
References | Authors | |
14 | 4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Paolo Bernardi | 1 | 244 | 30.63 |
Michelangelo Grosso | 2 | 34 | 6.16 |
Maurizio Rebaudengo | 3 | 746 | 79.10 |
Matteo Sonza Reorda | 4 | 1250 | 136.66 |