Title
Robust modular Bulk Built-in Current Sensors for detection of transient faults.
Year
Venue
Keywords
2012
SBCCI
sensors,nanoelectronics,cmos integrated circuits,fault tolerance
Field
DocType
Citations 
Nanoelectronics,Leakage (electronics),Soft error,Computer science,Electronic engineering,Real-time computing,CMOS,Robustness (computer science),Modular design,Transient analysis,Integrated circuit
Conference
9
PageRank 
References 
Authors
0.72
13
2
Name
Order
Citations
PageRank
Frank Sill Torres17014.65
Rodrigo Possamai Bastos28013.80