Name
Abstract | ||
|---|---|---|
A new compaction technique based on signature analysis is presented. Rather than comparing the final signature with the expected one after the test is completed, the binary output of the MISA is converted into an alternating binary signal by two simple cover circuits. An error is indicated whenever the alternation of the output signal is disturbed. This technique results in a higher fault coverage, improved fault diagnosis capability, a greater test autonomy in core-based designs, and early fault notification. |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1109/DATE.1998.655854 | DATE |
Keywords | Field | DocType |
binary signal,higher fault coverage,early fault notification,output signal,greater test autonomy,improved fault diagnosis capability,signature analysis,new compaction technique,binary output,final signature,logic,application specific integrated circuits,fault coverage,compaction,computer science | Stuck-at fault,Automatic test pattern generation,Fault coverage,Computer science,Algorithm,Application-specific integrated circuit,Real-time computing,Fault model,Built-in self-test,Fault indicator,Binary number | Conference |
ISBN | Citations | PageRank |
0-8186-8359-7 | 1 | 0.41 |
References | Authors | |
7 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| T. Bogue | 1 | 2 | 0.79 |
| M. Jürgensen | 2 | 1 | 0.41 |
| Y. Zorian | 3 | 499 | 47.97 |
| Michael Gössel | 4 | 271 | 42.58 |