Title
On Automatic-Verification Pattern Generation For Soc With Port-Order Fault Model
Abstract
Embedded cores are being increasingly used in the designs of large system-on-a-chip (SoC). Because of the high complexity of SoC, the design verification is a challenge for system integrators. To reduce the verification complexity, the port-order fault (POF) model has been used for verifying core-based designs (Tung and Jon, 1998). In this paper, we present an automatic-verification pattern generation (AVPG) for SoC design verification based on the POF model and perform experiments on combinational and sequential benchmarks. Experimental results show that our AVPG can efficiently generate verification patterns with high POF coverage.
Year
DOI
Venue
2002
10.1109/43.992770
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Keywords
DocType
Volume
automatic-verification pattern generation (AVPG), design verification, IEEE P1500, port-order fault (POF), SoC, undetected port sequence (UPS)
Journal
21
Issue
ISSN
Citations 
4
0278-0070
4
PageRank 
References 
Authors
0.47
4
3
Name
Order
Citations
PageRank
Wang Chun-Yao125136.08
Shing-Wu Tung2336.60
Jing-Yang Jou368188.55