Name
Abstract | ||
|---|---|---|
This paper presents enhanced reduced pin-count test (E-RPCT) for low-cost test. E-RPCT is an extension of traditional RPCT for circuits in which a large number of digital IC pins is multiplexed for scan. The basic concept of E-RPCT is to provide access to the internal scan chains via an IEEE 1149.1 compatible boundary-scan architecture, instead of direct access via the IC pins. The boundary-scan chain performs serial/parallel conversion of test data. E-RPCT also provides I/O wrap to test non-contacted pins. The paper presents E-RPCT for full-scan design, as well as for full-scan core-based design. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1023/A:1014989408897 | International Test Conference |
Keywords | Field | DocType |
pin-count test,low-cost test,enhanced reduced pin-count test,o wrap,direct access,extension oftraditional rpct,full-scan core-based design,large number ofdigital ic,ic pin,compatible boundary-scan architecture,basic conceptof,full-scan design,design for testability | Design for testing,Boundary scan,Computer science,Electronic engineering,Test data,Test compression,Computer hardware,Electronic circuit,Multiplexing,Embedded system | Journal |
Volume | Issue | ISSN |
18 | 2 | 1089-3539 |
ISBN | Citations | PageRank |
0-7803-7171-2 | 27 | 1.45 |
References | Authors | |
11 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Harald P. E. Vranken | 1 | 120 | 7.70 |
| Tom Waayers | 2 | 128 | 11.47 |
| Hérvé Fleury | 3 | 27 | 1.45 |
| David Lelouvier | 4 | 27 | 1.45 |