Paper Info
Title
Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing.
Year
DOI
Venue
2012
10.1007/s10836-012-5330-3
J. Electronic Testing
Field
DocType
Volume
Time domain,Frequency domain,Computer science,Signal generator,MEMS testing,Electronic engineering,Iddq testing,Current sensor,Mixed-signal integrated circuit,Analog signal
Journal
28
Issue
Citations 
PageRank 
5
0
0.34
References 
Authors
0
2
Name
Order
Citations
PageRank
Hsiu-Ming (Sherman) Chang1313.78
David C. Keezer26817.00