Name
Abstract | ||
|---|---|---|
One of the common failures found in manufactured ICs are interconnect opens. While stuck-at and transition fault automatic test pattern generation (ATPG) patterns can detect open defects, these fault models do not catch all of them. This poster describes a project and research with a new open fault model to supplement the others. The project consists of many parts that target specific types of known open defects. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/TEST.2010.5699303 | Test Conference |
Keywords | Field | DocType |
automatic test pattern generation,fault diagnosis,integrated circuit testing,open defect detection,open defect diagnosis,open fault model | Stuck-at fault,Automatic test pattern generation,Fault coverage,Computer science,Real-time computing,Interconnection,Fault model,Reliability engineering,Embedded system,Fault indicator | Conference |
ISSN | ISBN | Citations |
1089-3539 | 978-1-4244-7206-2 | 0 |
PageRank | References | Authors |
0.34 | 2 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Dat Tran | 1 | 454 | 78.64 |
| LeRoy Winemberg | 2 | 75 | 11.09 |
| Darrell Carder | 3 | 0 | 0.34 |
| Xijiang Lin | 4 | 687 | 42.03 |
| Joe LeBritton | 5 | 0 | 0.34 |
| Bruce Swanson | 6 | 107 | 8.97 |