Name
Title | ||
|---|---|---|
A general method to evaluate RF BIST techniques based on non-parametric density estimation |
Abstract | ||
|---|---|---|
We present a general method to evaluate RF Built-In Self-Test (BIST) techniques during the design stage. In particular, the adaptive kernel estimator is used to construct an estimate of the joint probability density function of the performances of the RF device under test and the actual BIST measurements. The density is sampled to generate a large volume of new data, which is subsequently used to estimate the relevant test metrics with parts per million (ppm) accuracy given the BIST limits. Thus, the BIST limits can be set to obtain the desired trade-offs between different test metrics. The proposed method aims to assist designers in comparing RF BIST techniques on the basis of accurately calculated test metrics and to provide information for early BIST refinements, thus reducing the design cycles. The method is demonstrated for a previously published RF BIST technique [1] applied to an LNA. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1145/1403375.1403394 | Proceedings of the conference on Design, automation and test in Europe |
Keywords | Field | DocType |
radio frequency,probability density function,robustness,device under test,system on chip,kernel,part per million,joint probability density function,probability,system testing | Non parametric density estimation,System on a chip,Device under test,Adaptive kernel,Computer science,Algorithm,Hardware reconfiguration,Real-time computing,Electronic engineering,Probability density function,Estimator,Built-in self-test | Conference |
ISSN | Citations | PageRank |
1530-1591 | 8 | 0.89 |
References | Authors | |
12 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Haralampos-G. D. Stratigopoulos | 1 | 252 | 28.06 |
| Jeanne Tongbong | 2 | 8 | 0.89 |
| Salvador Mir | 3 | 426 | 56.22 |