Haralampos-G. D. Stratigopoulos

Author Info

Name	Affiliation	Papers
HARALAMPOS-G. D. STRATIGOPOULOS	CNRS Grenoble INP UJF, TIMA Lab, 46 Av Felix Viallet, F-38031 Grenoble, France	49
Collaborators	Citations	PageRank
79	252	28.06
Referers	Referees	References
410	692	409

Search Limit

100692

Publications (49 rows)

Collaborators (79 rows)

Referers (100 rows)

Referees (100 rows)

Title	Citations	PageRank	Year
Reliability Analysis of a Spiking Neural Network Hardware Accelerator	0	0.34	2022
RF Transceiver Security Against Piracy Attacks	0	0.34	2022
Digitally Assisted Mixed-Signal Circuit Security	1	0.36	2022
SyncLock: RF Transceiver Security Using Synchronization Locking	0	0.34	2022
BIST-Assisted Analog Fault Diagnosis	0	0.34	2021
Analog and Mixed-Signal IC Security Via Sizing Camouflaging	1	0.36	2021
Locking by Untuning: A Lock-Less Approach for Analog and Mixed-Signal IC Security	0	0.34	2021
Neuron-PUF: Physical Unclonable Function Based on a Single Spiking Neuron	1	0.35	2021
Breaking Analog Biasing Locking Techniques via Re-Synthesis	2	0.38	2021
SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety	0	0.34	2021
Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism	0	0.34	2020
Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP	0	0.34	2020
Securing Programmable Analog ICs Against Piracy	0	0.34	2020
MixLock: Securing Mixed-Signal Circuits via Logic Locking	0	0.34	2019
IP Session on Machine Learning Applications in IC Test-Related Tasks	0	0.34	2019
Adaptive Test With Test Escape Estimation for Mixed-Signal ICs.	0	0.34	2018
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.	0	0.34	2017
Recap of the European Test Symposium 2017 (ETS'17).	0	0.34	2017
Built-in test of millimeter-Wave circuits based on non-intrusive sensors	0	0.34	2016
A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC.	0	0.34	2016
ETS 2016 foreword	0	0.34	2016
Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques.	2	0.39	2016
One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits.	5	0.46	2016
A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs.	3	0.51	2016
Guest Editors' Introduction: Top Papers from the 2015 International Test Conference.	0	0.34	2016
Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique	6	0.50	2015
Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors	0	0.34	2015
Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors	1	0.36	2015
Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times	4	0.46	2015
Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion	5	0.55	2015
High frequency jitter estimator for SoCs	3	0.47	2015
Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST.	0	0.34	2014
One-Shot Calibration of RF Circuits Based on Non-Intrusive Sensors	10	0.74	2014
Fault modeling and diagnosis for nanometric analog circuits	0	0.34	2013
Multivariate Statistical Techniques For Analog Parametric Test Metrics Estimation	3	0.41	2013
Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers.	0	0.34	2012
Diagnosis of Local Spot Defects in Analog Circuits.	23	0.96	2012
RF specification test compaction using learning machines	7	0.64	2010
Density estimation for analog/RF test problem solving	0	0.34	2010
Special session 12A: Panel adaptive analog test: Feasibility and opportunities ahead	0	0.34	2010
Sensors for built-in alternate RF test	22	1.22	2010
Analog Neural Network Design For Rf Built-In Self-Test	8	0.59	2010
Enrichment of limited training sets in machine-learning-based analog/RF test	12	0.70	2009
Evaluation of analog/RF test measurements at the design stage	31	2.23	2009
Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing	51	3.27	2008
A general method to evaluate RF BIST techniques based on non-parametric density estimation	8	0.89	2008
Non-RF to RF Test Correlation Using Learning Machines: A Case Study	38	2.10	2007
Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing	4	0.69	2006
Generating decision regions in analog measurement spaces	1	0.36	2005