Name
Abstract | ||
|---|---|---|
Bit flips provoked by radiation are a main concern for space applications. A fault injection experiment performed using a software simulator is described in this paper. Obtained results allow us to predict a low sensitivity to soft errors for the studied application, putting in evidence critical memory elements. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/DFTVS.2002.1173507 | DFT |
Keywords | Field | DocType |
space application,injecting bit flip faults,low sensitivity,obtained resultsallow,main concern,fault injectionexperiment,purely software approach,evidencecritical memory element,case studied,soft error,software simulator,silicon,space technology,atmosphere,system testing,space charge,sensitivity analysis,computer aided software engineering,neutrons | Microelectronic circuits,Space technology,System testing,Computer science,Electronic engineering,Software,Aerospace electronics,Computer-aided software engineering,Software simulator,Fault injection | Conference |
ISSN | ISBN | Citations |
1550-5774 | 0-7695-1831-1 | 8 |
PageRank | References | Authors |
1.47 | 1 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Raoul Velazco | 1 | 124 | 19.48 |
| Corominas, A. | 2 | 8 | 1.47 |
| Ferreyra, P. | 3 | 8 | 1.47 |