Name
Abstract | ||
|---|---|---|
Defect diagnosis can benefit from fault dominance relations to reduce the set of defect candidate sites. This paper presents new fault dominance collapsing operators that further reduce the set of candidates considered during the initial phase of diagnosis. In contrast to existing dominance-based methods which operate on pairs of faults, the proposed method operates on sets of faults. Fault-related entities are generated to guide the diagnosis process. The proposed collapsing operators can be used to accelerate effect-cause diagnosis. Experimental results demonstrate that the proposed method achieves a higher collapsing ratio than existing methods. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1016/j.vlsi.2011.01.002 | Integration |
Keywords | Field | DocType |
improved diagnosis,effect-cause diagnosis,fault-related entity,defect diagnosis,new fault dominance,enhanced fault dominance,dominance-based method,defect candidate site,diagnosis process,fault dominance relation | Computer science,Algorithm,Real-time computing,Operator (computer programming),Computer engineering | Journal |
Volume | Issue | ISSN |
44 | 3 | Integration, the VLSI Journal |
Citations | PageRank | References |
1 | 0.36 | 22 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Rajsekhar Adapa | 1 | 35 | 3.92 |
| Spyros Tragoudas | 2 | 625 | 88.87 |
| Maria K. Michael | 3 | 176 | 25.89 |