Name
Title | ||
|---|---|---|
Improved methods for worst-case analysis and optimization incorporating operating tolerances |
Abstract | ||
|---|---|---|
Worst-case analysis is commonly used in integrated circuit design to verify a satisfactory cir- cuit performance with regard to changes in the man- ufacturing conditions. However, worst-case analysis is often carried out using approximate worst-case pa- rameter sets, that do not consider fluctuations in the operating conditions. This paper presents a new ap preach to the worst-case design of integrated circuits that takes account of fluctuations in the operating conditions. It provides unique and realistic worst- case manufacturing conditions and worst-case operat- ing conditions for given circuit specifications. These specifications may be either, minimum yield require- ments or, lower and upper performance bounds. A software package for worst-case analysis and optimiza- tion is presented and illustrated by two examples. |
Year | DOI | Venue |
|---|---|---|
1993 | 10.1145/157485.164641 | DAC |
Keywords | Field | DocType |
improved method,operating tolerance,worst-case analysis,voltage,manufacturing,operant conditioning,integrated circuit,circuit topology,fluctuations,integrated circuit design | Computer science,Voltage,Electronic engineering,Software,Integrated circuit design,Circuit performance,Integrated circuit,Case analysis,Topology (electrical circuits) | Conference |
ISSN | ISBN | Citations |
0738-100X | 0-89791-577-1 | 6 |
PageRank | References | Authors |
1.47 | 6 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Helmut E. Graeb | 1 | 269 | 36.22 |
| Claudia U. Wieser | 2 | 45 | 9.87 |
| Kurt J. Antreich | 3 | 66 | 9.77 |