Name
Abstract | ||
|---|---|---|
This paper describes a new algorithm for the extraction of the critical area for opens. The presented algorithm allows for the analysis of large ICs and non-Manhattan geometry. Concept of the contact/via contacting regions is proposed and its relevance is discussed. Illustrative examples of the proposed algorithm are presented. |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1109/DFTVS.1996.571981 | DFT |
Keywords | Field | DocType |
non-manhattan geometry,critical area,large vlsi circuit,large ics,illustrative example,proposed algorithm,new algorithm,algorithm design and analysis,geometry,manufacturing,vlsi,very large scale integration | Algorithm design,Computer science,Extraction algorithm,Electronic engineering,Critical area,Very-large-scale integration | Conference |
ISBN | Citations | PageRank |
0-8186-7545-4 | 11 | 1.31 |
References | Authors | |
7 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| C. H. Ouyang | 1 | 21 | 2.48 |
| W. A. Pleskacz | 2 | 34 | 4.10 |
| Wojciech Maly | 3 | 1976 | 352.57 |