Name
Title | ||
|---|---|---|
Analysis and measurement of timing jitter induced by radiated emi noise in automatic test equipment |
Abstract | ||
|---|---|---|
This paper deals with the generation, measurement and modeling of the jitter encountered in the signals of a testhead board for automatic test equipment (ATE). A novel model is proposed for the jitter; this model takes into account the radiated electromagnetic interference (EMI) noise in the head of an ATE. The RMS value of the jitter is measured at the output signal of the testhead board to valid... |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1109/TIM.2003.818727 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Noise measurement,Timing jitter,Electromagnetic interference,Automatic test equipment,Electromagnetic measurements,Electromagnetic modeling,Circuit noise,Phase locked loops,Signal generators,Automatic testing | Phase-locked loop,500 kHz,Automatic test equipment,Electromagnetic interference,Electronic engineering,Transfer function,Jitter,Ground noise,Mathematics,EMI | Journal |
Volume | Issue | ISSN |
52 | 6 | 0018-9456 |
Citations | PageRank | References |
2 | 0.65 | 4 |
Authors | ||
8 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jaeyoung Lee | 1 | 454 | 102.07 |
| T. Kane | 2 | 2 | 0.99 |
| J.-J. Lim | 3 | 2 | 0.65 |
| L. Schiano | 4 | 53 | 8.35 |
| Y.-B. Kim | 5 | 2 | 0.99 |
| F. J. Meyer | 6 | 2 | 0.99 |
| F. Lombardi | 7 | 232 | 24.13 |
| S. Max | 8 | 28 | 1.97 |