| On the Computational Complexity of Tile Set Synthesis for DNA Self-Assembly | 4 | 0.70 | 2009 |
| A Serial Memory by Quantum-Dot Cellular Automata (QCA) | 24 | 1.60 | 2008 |
| Synthesis of Tile Sets for DNA Self-Assembly | 21 | 1.98 | 2008 |
| Two-Dimensional Schemes for Clocking/Timing of QCA Circuits | 41 | 2.32 | 2008 |
| Reversible Gates and Testability of One Dimensional Arrays of Molecular QCA | 17 | 1.43 | 2008 |
| Design of sequential circuits by quantum-dot cellular automata | 19 | 1.41 | 2007 |
| Analysis of missing and additional cell defects in sequential quantum-dot cellular automata | 13 | 0.83 | 2007 |
| QCA Circuits for Robust Coplanar Crossing | 7 | 0.70 | 2007 |
| A Comparative Evaluation of Designs for Reliable Memory Systems | 3 | 0.54 | 2005 |
| Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation | 19 | 1.40 | 2005 |
| Scan Test of IP Cores in an ATE Environment | 0 | 0.34 | 2004 |
| Modeling and analysis of fault tolerant multistage interconnection networks | 6 | 0.50 | 2003 |
| Adaptive algorithms for maximal diagnosis of wiring interconnects | 3 | 0.45 | 2003 |
| Parallel testing of multi-port static random access memories | 2 | 0.48 | 2003 |
| Optimal Spare Utilization in Repairable and Reliable Memory Cores | 9 | 0.79 | 2003 |
| Analysis and measurement of timing jitter induced by radiated emi noise in automatic test equipment | 2 | 0.65 | 2003 |
| Yield Analysis of Compiler-Based Arrays of Embedded SRAMs | 2 | 0.41 | 2003 |
| Fault Tolerant Memory Design for HW/SW Co-Reliability in Massively Parallel Computing Systems | 1 | 0.35 | 2003 |
| A digital and wide power bandwidth H-field generator for automatic test equipment | 0 | 0.34 | 2003 |
| Hardware/Software Co-Reliability of Configurable Digital Systems | 0 | 0.34 | 2002 |
| Quality enhancement of reconfigurable multichip module systems by redundancy utilization | 3 | 0.43 | 2002 |
| Analysis of stratified testing for multichip module systems | 2 | 0.38 | 2002 |
| Connectivity-Based Multichip Module Repair | 1 | 0.35 | 2001 |
| Modeling the Dependability of N-Modular Redundancy on Demand under Malicious Agreement | 3 | 0.45 | 2001 |
| Quality-effective repair of multichip module systems | 4 | 0.54 | 2000 |
| Fault-tolerant rank order filtering for image enhancement. | 0 | 0.34 | 1999 |
| A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD | 1 | 0.36 | 1999 |
| Structural diagnosis of interconnects by coloring | 2 | 0.38 | 1998 |
| Embedded Fault-Tolerant Systems | 4 | 0.47 | 1998 |
| Conformance testing of time-dependent protocols | 0 | 0.34 | 1996 |
| FsmTest: functional test generation for sequential circuits | 8 | 0.65 | 1996 |
| An improved approach to fault tolerant rank order filtering on a SIMD mesh processor | 0 | 0.34 | 1995 |
| Constant testability of combinational cellular tree structures | 7 | 0.70 | 1992 |
| Multiple stuck-at faults detection in CMOS combinational gates | 1 | 0.39 | 1991 |
| An algorithm for functional reconfiguration of fixed-size arrays | 3 | 0.47 | 1988 |
