Paper Info
Title
Application of Formal Word-Level Analysis to Constrained Random Simulation
Abstract
Constrained random simulation is supported by constraint solvers integrated within simulators. These constraint solvers need to be fast and memory efficient to maintain simulation performance. Binary Decision Diagrams (BDDs) have been successfully applied to represent constraints in this context. However, BDDs are vulnerable to size explosions depending on the constraints they are representing and the number of Boolean variables appearing in them. In this paper, we present a word-level analysis tool DomRedto reduce the number of Boolean variables required to represent constraints by reducing the domain of constraint variables. DomRedemploys static analysis techniques to obtain these reductions. We present experimental results to illustrate the impact of this tool.
Year
DOI
Venue
2008
10.1007/978-3-540-70545-1_46
CAV
Keywords
Field
DocType
size explosion,boolean variable,word-level analysis tool,domredemploys static analysis technique,constraint variable,formal word-level analysis,binary decision diagrams,random simulation,constrained random simulation,simulation performance,constraint solvers,static analysis,binary decision diagram
Computer science,Static analysis,Algorithm,Binary decision diagram,Theoretical computer science,Constraint satisfaction problem,Boolean data type,Hardware description language,Random simulation
Conference
Volume
ISSN
Citations 
5123
0302-9743
10
PageRank 
References 
Authors
0.70
4
7
Name
Order
Citations
PageRank
Hyondeuk Kim1282.67
HoonSang Jin224415.15
Kavita Ravi342221.67
Petr Spacek4161.83
John Pierce5100.70
Bob Kurshan6100.70
Fabio Somenzi73394302.47