Name
Title | ||
|---|---|---|
Validating manufacturing processes using timed sequential machines: application to a semiconductor manufacturing process (WIP) |
Abstract | ||
|---|---|---|
Process diagnostics is a difficult task that concerns most enterprises. Our methodology proposes the construction of process models from different sources of information. It uses their comparison to help experts answer some of the questions she/he is confronted when analyzing processes. The application to STMicroelectronics is presented in this article. This methodology can help this enterprise to validate their manufacturing processes. |
Year | Venue | Keywords |
|---|---|---|
2012 | SpringSim (TMS-DEVS) | process model,manufacturing process,semiconductor manufacturing process,different source,process diagnostics,sequential machine,difficult task,validating manufacturing,covering relation,devs |
Field | DocType | Volume |
Semiconductor device fabrication,Process modeling,Computer-integrated manufacturing,Manufacturing engineering,Real-time computing,DEVS,Engineering,Manufacturing process | Conference | 44 |
Issue | ISSN | Citations |
4 | 0735-9276 | 0 |
PageRank | References | Authors |
0.34 | 3 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Pamela Viale | 1 | 3 | 1.91 |
| Norbert Giambiasi | 2 | 227 | 37.59 |
| Claudia Frydman | 3 | 113 | 18.14 |
| Jacques Pinaton | 4 | 19 | 12.98 |