Name
Abstract | ||
|---|---|---|
This paper presents an extensive evaluation of the manufacturing yield of embedded SRAMs (eSRAM) which are designed using a memory compiler. The yield is evaluated by considering the different design constructs (generally referred to as kernels) that are used in defining the memory architecture through a compiler. Architectural considerations such as array size and line (word and bit) organization are analyzed. Compiler-based features of different kernels(such as required for decoding) are also treated in detail. An extensive evaluation of the provided redundancy (row, column and combined) is pursued to characterize its impact on the memory yield. Industrial data is used in the evaluation and an industrial ASIC chip (made of multiple eSRAMs) is also considered as design case. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/DFTVS.2004.1347820 | DFT |
Keywords | Field | DocType |
manufacturing yield,industrial asic chip,memory yield,industrial data,design case,extensive evaluation,compiler-based esrams,different design construct,memory architecture,different kernel,memory compiler,integrated circuit design,application specific integrated circuits,redundancy,chip | Computer architecture,Computer science,Application-specific integrated circuit,Compiler,Real-time computing,Redundancy (engineering),Integrated circuit design,Decoding methods,Physical design,Memory architecture | Conference |
ISBN | Citations | PageRank |
0-7695-2241-6 | 6 | 0.64 |
References | Authors | |
3 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| X. Wang | 1 | 8 | 1.05 |
| M. Ottavi | 2 | 166 | 19.26 |
| F. Meyer | 3 | 6 | 0.64 |
| F. Lombardi | 4 | 122 | 15.25 |