Title | ||
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Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST |
Abstract | ||
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This paper presents a method for extracting, in the digital domain, the main characteristic parameters of an analog sine-wave signal. It is based on a double-modulation, square-wave and sigma-delta, together with a simple Digital Processing Algorithm. It leads to an efficient and robust approach very suitable for BIST applications. In this line, some considerations for on-chip implementation are addressed together with simulation results that validate the feasibility of the proposed approach. |
Year | DOI | Venue |
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2005 | 10.1007/s10836-005-6352-x | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS |
Keywords | DocType | Volume |
mixed-signal testing,analog testing,BIST,sigma-delta modulation | Journal | 21 |
Issue | ISSN | Citations |
3 | 0923-8174 | 2 |
PageRank | References | Authors |
0.39 | 6 | 7 |
Name | Order | Citations | PageRank |
---|---|---|---|
Diego Vázquez | 1 | 136 | 15.33 |
Gloria Huertas | 2 | 74 | 13.29 |
África Luque | 3 | 2 | 0.72 |
Manuel J. Barragan Asian | 4 | 53 | 7.27 |
Gildas Leger | 5 | 51 | 9.99 |
Adoración Rueda | 6 | 275 | 40.01 |
José Luis Huertas | 7 | 77 | 9.97 |