Name
Year | DOI | Venue |
|---|---|---|
1991 | 10.1109/TEST.1991.519775 | ITC |
Keywords | Field | DocType |
parallel pattern generators,parallel programming,hardware,computer languages,system testing,software design | Semiconductor memory,Software design,Fuzz testing,Read-write memory,Computer science,System testing,White-box testing,Memory address,Computer hardware,Computer memory | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-8186-9156-5 | 0 |
PageRank | References | Authors |
0.34 | 0 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kanzaki, M. | 1 | 0 | 0.68 |
| Masahiro Ishida | 2 | 105 | 22.58 |