Name
Abstract | ||
|---|---|---|
Data Path Direct Access Test, DPDAT, supportsefficient structural test of targeted datapath blocksusing existing non-datapath DFT features inconjunction with architectural transparency alreadypresent in surrounding datapath blocks. This newDFT technique allows ATPG patterns generated atlogic block levels to be applied at the full chipwithout expensive DFT overhead. The results ofinvestigating feasibility on Intel® Pentium® 4 showexistence of these natural transparent paths, lowarea overhead and high fault coverage usingsequential ATPG techniques under DPDAT. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/TEST.2001.966633 | ITC |
Keywords | Field | DocType |
targeted datapath,atpg technique,data path direct access,existing non-datapath,atlogic block level,architectural transparency alreadypresent,lowarea overhead,datapath block,chipwithout expensive dft overhead,atpg pattern,logic design,fault coverage,computer architecture,feasibility,sequential analysis,automatic test pattern generation,structural testing,sequential circuits,design for testability,chip | Design for testing,Logic synthesis,Automatic test pattern generation,Datapath,Sequential logic,Fault coverage,Computer science,Parallel computing,Electronic engineering,Pentium,Logic block | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-7169-0 | 1 |
PageRank | References | Authors |
0.49 | 10 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kee Sup Kim | 1 | 648 | 39.43 |
| R. Jayabharathi | 2 | 12 | 4.42 |
| Craig Carstens | 3 | 4 | 0.89 |
| Praveen Vishakantaiah | 4 | 66 | 4.34 |
| Derek Feltham | 5 | 78 | 11.38 |
| Adrian Carbine | 6 | 65 | 9.77 |