Name
Title | ||
|---|---|---|
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling |
Abstract | ||
|---|---|---|
It has become necessary to reduce power during LSI testing. Particularly, during at-speed testing, excessive power consumed during the Launch-To-Capture (LTC) cycle causes serious issues that may lead to the overkill of defect-free logic ICs. Many successful test generation approaches to reduce IR-drop and/or power supply noise during LTC for the launch-off capture (LOC) scheme have previously been proposed, and several of X-filling techniques have proven especially effective. With X-filling in the launch-off shift (LOS) scheme, however, adjacent-fill (which was originally proposed for shift-in power reduction) is used frequently. In this work, we propose a novel X-filling technique for the LOS scheme, called Adjacent-Probability-based X-Filling (AP-fill), which can reduce more LTC power than adjacent-fill. We incorporate AP-fill into a post-ATPG test modification flow consisting of test relaxation and X-filling in order to avoid the fault coverage loss and the test vector count inflation. Experimental results for larger ITC'99 circuits show that the proposed AP-fill technique can achieve a higher power reduction ratio than 0-fill, 1-fill, and adjacent-fill. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ATS.2011.35 | Asian Test Symposium |
Keywords | Field | DocType |
adjacent-probability-based x-filling,los scheme,successful test generation approach,post-atpg test modification flow,effective launch-to-capture power reduction,test vector count inflation,excessive power,test relaxation,higher power reduction ratio,shift-in power reduction,power supply noise,ltc power,x-filling technique,integrated circuit,probability,testing,logic gate,vectors,fault coverage,logic gates | Test vector,Logic gate,Power network design,Fault coverage,Computer science,Electronic engineering,Real-time computing,Electronic circuit,Test power | Conference |
ISSN | Citations | PageRank |
1081-7735 | 1 | 0.36 |
References | Authors | |
12 | 11 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| K. Miyase | 1 | 116 | 6.12 |
| Y. Uchinodan | 2 | 1 | 0.36 |
| K. Enokimoto | 3 | 10 | 0.92 |
| Y. Yamato | 4 | 39 | 2.42 |
| X. Wen | 5 | 1 | 0.36 |
| S. Kajihara | 6 | 438 | 34.85 |
| F. Wu | 7 | 1 | 0.36 |
| L. Dilillo | 8 | 44 | 9.49 |
| A. Bosio | 9 | 113 | 15.51 |
| P. Girard | 10 | 478 | 41.91 |
| A. Virazel | 11 | 169 | 23.25 |