Name
Abstract | ||
|---|---|---|
Cracks in Multilayer Capacitors are often latent defects, which are not recognized in production, but can cause substantial problems in field. Therefore it is important to find possibilities to detect those candidates before delivering electronic equipment. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1016/j.microrel.2006.07.082 | Microelectronics Reliability |
Keywords | Field | DocType |
electronic control unit | Ceramic capacitor,Capacitor,Emission spectrum,Electronic engineering,Control unit,Electronic equipment,Engineering,Spectroscopy,Fissure,Piezoelectricity | Journal |
Volume | Issue | ISSN |
46 | 9 | 0026-2714 |
Citations | PageRank | References |
2 | 0.61 | 0 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| V. Krieger | 1 | 2 | 0.61 |
| W. Wondrak | 2 | 18 | 5.61 |
| A. Dehbi | 3 | 9 | 2.05 |
| W. Bartel | 4 | 2 | 0.61 |
| Y. Ousten | 5 | 16 | 5.71 |
| B. Levrier | 6 | 3 | 1.21 |