Y. Ousten - Citegraph

Author Info

Name	Affiliation	Papers
Y. OUSTEN	IMS Laboratory, University of Bordeaux I-ENSEIRB-CNRS UMR 5218, 351 Cours de la Libération, 33405 Talence Cedex, France	12
Collaborators	Citations	PageRank
52	16	5.71
Referers	Referees	References
49	4	1

Publications (12 rows)

Collaborators (52 rows)

Referers (49 rows)

Referees (4 rows)

Title	Citations	PageRank	Year
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses	4	0.88	2010
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation	2	0.50	2008
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications	0	0.34	2008
Defect detection in multilayer ceramic capacitors.	2	0.61	2006
Failure mechanisms and qualification testing of passive components	0	0.34	2005
Vibration lifetime modelling of PCB assemblies using steinberg model	2	0.49	2005
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.	0	0.34	2004
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits	0	0.34	2003
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets)	1	0.60	2002
Evaluation of a micropackaging analysis technique by highfrequency microwaves	0	0.34	2002
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions	0	0.34	2002
High temperature reliability testing of aluminum and tantalum electrolytic capacitors	5	0.62	2002

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