Name
Title | ||
|---|---|---|
Variable delay of multi-gigahertz digital signals for deskew and jitter-injection test applications |
Abstract | ||
|---|---|---|
The ability to precisely control the timing of digital signals is especially important for multi-GHz testing applications where errors are measured in picoseconds or even 100fs. While many solutions exist for continuous clock-type signals, delay of wide-bandwidth data signals is not so easy. In this paper we introduce a novel technique for adjusting the delay of ~7 Gbps data signals on a picosecond scale without significant distortion. The approach is based on a timing/amplitude dependency effect observed in a variable-gain SiGe buffer. A prototype is demonstrated with a variable delay range of about 50 ps. This circuit is enhanced by adding a "coarse" delay section, including four 33 ps steps, to provide the desired total range of ~140 ps. The end application requires several of these circuits for deskewing parallel buses of 6.4 Gbps ATE signals. The circuit is also useful for injecting a variable amount of jitter, limited by the fine-delay adjustment range. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1145/1403375.1403732 | Proceedings of the conference on Design, automation and test in Europe |
Keywords | Field | DocType |
prototypes,picoseconds,testing,digital circuits,error correction,circuits,jitter,germanium | Digital signal,Computer science,Logic testing,Automatic testing,Real-time computing,Electronic engineering,Picosecond,Jitter,Electronic circuit,Distortion,Amplitude | Conference |
ISSN | ISBN | Citations |
1530-1591 | 978-3-9810801-4-8 | 3 |
PageRank | References | Authors |
0.70 | 3 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David C. Keezer | 1 | 68 | 17.00 |
| Dany Minier | 2 | 28 | 4.32 |
| P. Ducharme | 3 | 10 | 2.39 |