Name
Abstract | ||
|---|---|---|
The aim of this paper is to present a methodology for extracting configuration-specific test patterns for FPGA cells, from the set of sequences that test all stuck-at-faults for the unconfigured cell. This is achieved through the construction of an automaton that recognizes test sequences for all faults, followed by the extraction of a second automaton that recognizes only the non-redundant faults with respect to a given configuration. Since structural information is not needed for sequence extraction, this methodology provides the user with a structural fault model while granting protection of Intellectual Property. |
Year | DOI | Venue |
|---|---|---|
1997 | 10.1109/DFTVS.1997.628313 | DFT |
Keywords | Field | DocType |
unconfigured cell,structural fault model,sequence extraction,intellectual property,fpga cell,configuration-specific test pattern,structural information,field programmable gate arrays,non-redundant fault,configuration-specific test pattern extraction,test sequence,manufacturing,automata,data mining,intellectual property protection,field programmable gate array,application specific integrated circuits | Stuck-at fault,Automatic test pattern generation,Computer science,Automaton,Programmable logic array,Automatic testing,Field-programmable gate array,Electronic engineering,Application-specific integrated circuit,Computer engineering,Fault model | Conference |
ISBN | Citations | PageRank |
0-8186-8168-3 | 2 | 0.40 |
References | Authors | |
7 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Fabrizio Ferrandi | 1 | 548 | 56.95 |
| Franco Fummi | 2 | 1001 | 111.62 |
| L. Pozzi | 3 | 2 | 1.08 |
| Mariagiovanna Sami | 4 | 314 | 39.98 |