Name
Title | ||
|---|---|---|
Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells. |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/ESSDERC.2012.6343347 | ESSDERC |
Keywords | Field | DocType |
threshold voltage | Orders of magnitude (numbers),Flash memory,Electronic engineering,Parameter space,Threshold voltage,Standard deviation,Materials science | Conference |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Valentina Bonfiglio | 1 | 0 | 0.34 |
| Giuseppe Iannaccone | 2 | 152 | 24.49 |