Name
Title | ||
|---|---|---|
Built-in generation of functional broadside tests considering primary input constraints |
Abstract | ||
|---|---|---|
This paper describes a method for built-in generation of functional broadside tests for a circuit that is embedded in a larger design, taking functional constraints on its primary input sequences into account. The constraints are captured by functional input sequences of the design. Specifically, the peak switching activity in the circuit under the functional input sequences is used to bound the switching activity during on-chip test generation. |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1145/2591513.2591560 | ACM Great Lakes Symposium on VLSI |
Keywords | Field | DocType |
primary input constraints,functional broadside tests,built-in tests,transition faults,built-in test generation | Broadside,Computer science,Real-time computing,Electronic engineering | Conference |
ISSN | Citations | PageRank |
1066-1395 | 0 | 0.34 |
References | Authors | |
4 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bo Yao | 1 | 0 | 0.68 |
| Irith Pomeranz | 2 | 3829 | 336.84 |
| Srikanth Venkataraman | 3 | 572 | 48.05 |
| Enamul Amyeen | 4 | 145 | 9.82 |