Author Info
Name
Affiliation
Papers
BO YAO
Purdue Univ, ECE, W Lafayette, IN 47907 USA
2
Collaborators
Citations 
PageRank 
5
0
0.68
Referers 
Referees 
References 
0
33
19
Title
Citations
PageRank
Year
Functional Broadside Test Generation Using a Commercial ATPG Tool00.342017
Built-in generation of functional broadside tests considering primary input constraints00.342014