Title
On Delay Test Quality for Test Cubes.
Year
DOI
Venue
2010
10.2197/ipsjtsldm.3.283
IPSJ T. on System LSI Design Methodology
DocType
Volume
Citations 
Journal
3
0
PageRank 
References 
Authors
0.34
9
5
Name
Order
Citations
PageRank
Shinji Oku100.34
Seiji Kajihara298973.60
Yasuo Sato3384.46
Kohei Miyase456238.71
Xiaoqing Wen579077.12