Name
Year | DOI | Venue |
|---|---|---|
1992 | 10.1109/TEST.1992.527827 | ITC |
Keywords | Field | DocType |
mcm test,available technology,microelectronics,system testing,packaging | System testing,Microelectronics,Circuit design,Electronic engineering,Engineering,Materials testing | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-0760-7 | 0 |
PageRank | References | Authors |
0.34 | 0 | 1 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David C. Keezer | 1 | 68 | 17.00 |