Title
A Cost-efficient Input Vector Monitoring Concurrent On-line BIST Scheme Based on Multilevel Decoding Logic
Abstract
Input vector monitoring concurrent on-line BIST based on multilevel decoding logic is an attractive approach to reduce hardware overhead. In this paper, a novel optimization scheme is proposed for further reducing the hardware overhead of the decoding structure, which refers to improved decoding, input reduction, and simulated annealing inputs swapping approaches. Furthermore, utilizing similar multilevel decoding logic as the responses verifier, a novel cost-efficient input vector monitoring concurrent on-line BIST scheme is presented. The proposed scheme is applicable to the concurrent on-line testing for the CUT, the detail of which can not be obtained, such as hard IP cores. Experimental results indicate that the proposed optimization approaches can significantly reduce the hardware overhead of the decoding structure, and the proposed scheme costs lower hardware than other existing schemes.
Year
DOI
Venue
2013
10.1007/s10836-013-5380-1
J. Electronic Testing
Keywords
Field
DocType
Input vector monitoring,On-line testing,Off-line testing,Concurrent self-test,Built-in self-test
Simulated annealing,Swap (computer programming),Computer science,Electronic engineering,Real-time computing,Decoding methods,Cost efficiency,Built-in self-test
Journal
Volume
Issue
ISSN
29
4
0923-8174
Citations 
PageRank 
References 
0
0.34
16
Authors
5
Name
Order
Citations
PageRank
Tiebin Wu162.14
Hengzhu Liu28623.28
Peng-Xia Liu361.13
Dongsheng Guo439931.61
Hai-Ming Sun500.34