Name
Title | ||
|---|---|---|
A Selective Scan Chain Activation Technique For Minimizing Average And Peak Power Consumption |
Abstract | ||
|---|---|---|
In this paper, we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed method constantly reduces the average and peak power consumption during scan testing. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1587/transinf.E93.D.193 | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS |
Keywords | Field | DocType |
design for testability (DfT), scan testing, scan cell reordering, low power test | Design for testing,Computer vision,Telecommunications,Computer science,Scan chain,Artificial intelligence,Computer hardware,Activation technique,Power consumption,Low-power electronics | Journal |
Volume | Issue | ISSN |
E93D | 1 | 1745-1361 |
Citations | PageRank | References |
0 | 0.34 | 6 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yong-Joon Kim | 1 | 118 | 13.73 |
| Jaeseok Park | 2 | 19 | 6.05 |
| Sungho Kang | 3 | 436 | 78.44 |