Name
Affiliation
Papers
SUNGHO KANG
Computer Systems Laboratory, Yonsei University, Republic of Korea
147
Collaborators
Citations 
PageRank 
180
436
78.44
Referers 
Referees 
References 
933
1939
1041
Search Limit
1001000
Title
Citations
PageRank
Year
Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs00.342021
Fail Memory Configuration Set for RA Estimation10.362020
Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks.10.362020
Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks00.342020
A New Logic Topology-Based Scan Chain Stitching For Test-Power Reduction10.362020
TSV Repair Architecture for Clustered Faults.10.372019
Test-Friendly Data-Selectable Self-Gating (DSSG)00.342019
Dynamic Built-In Redundancy Analysis for Memory Repair.10.352019
Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis.10.362018
Thermal Aware Test Scheduling for NTV Circuit.20.492018
An Area-Efficient BIRA With 1-D Spare Segments.00.342018
R2-TSV: A Repairable and Reliable TSV Set Structure Reutilizing Redundancies.00.342017
Reconfigurable Scan Architecture For Test Power And Data Volume Reduction00.342017
Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares.70.562017
Chain-Based Approach for Fast Through-Silicon-Via Coupling Delay Estimation.00.342017
A Novel X-Filling Method For Capture Power Reduction00.342017
Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs.10.372017
A Survey of Repair Analysis Algorithms for Memories.10.352016
A New 3-D Fuse Architecture to Improve Yield of 3-D Memories.00.342016
Discussion of cost-effective redundancy architectures00.342016
P-Backtracking: A New Scan Chain Diagnosis Method With Probability00.342016
A Test Methodology To Screen Scan-Path Failures00.342016
Process Variation-Aware Bridge Fault Analysis00.342016
Optimized Built-In Self-Repair for Multiple Memories.10.352016
A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs10.372016
Reduced-Code Test Method Using Sub-Histograms For Pipelined Adcs00.342015
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability40.412015
Eco Assist Techniques through Real-time Monitoring of BEV Energy Usage Efficiency00.342015
A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability30.412015
Near optimal repair rate built-in redundancy analysis with very small hardware overhead00.342015
A scan shifting method based on clock gating of multiple groups for low power scan testing60.472015
A New Fuse Architecture and a New Post-Share Redundancy Scheme for Yield Enhancement in 3-D-Stacked Memories50.462014
Recovery-Enhancing Task Scheduling For Multicore Processors Under Nbti Impact00.342014
A Novel Test Access Mechanism For Parallel Testing Of Multi-Core System10.362014
A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories40.592014
Dynamic Thermal Management For 3d Multicore Processors Under Process Variations00.342013
Thermal-Aware Dynamic Voltage Frequency Scaling For Many-Core Processors Under Process Variations30.422013
Acceleration Of Deep Packet Inspection Using A Multi-Byte Processing Prefilter00.342013
Built-In Self-Test For Static Adc Testing With A Triangle-Wave00.342013
A Method For The Fast Diagnosis Of Multiple Defects Using An Efficient Candidate Selection Algorithm00.342012
An Accurate Diagnosis Of Transition Fault Clusters Based On Single Fault Simulation00.342012
Integration of dual channel timing formatter system for high speed memory test equipment111.572012
An efficient IP address lookup algorithm based on a small balanced tree using entry reduction30.422012
Noise-Tolerant Dac Bist Scheme Using Integral Calculus Approach00.342011
Communication-aware task scheduling and voltage selection for total energy minimization in a multiprocessor system using Ant Colony Optimization.120.572011
Path search engine for fast optimal path search using efficient hardware architecture00.342011
EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate40.392010
A Memory-Efficient Pattern Matching With Hardware-Based Bit-Split String Matchers For Deep Packet Inspection10.402010
A High Performance Network-On-Chip Scheme Using Lossless Data Compression20.482010
A Selective Scan Chain Activation Technique For Minimizing Average And Peak Power Consumption00.342010
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