Title
Multisine With Optimal Phase-Plane Uniformity for ADC Testing
Abstract
A multisine excitation signal enables fast and statistically robust measurement of the nonlinear behavior of analog devices under test. This paper describes the design considerations and constraints of a multisine excitation signal when it is applied to analog-to-digital converter testing. A novel phase-plane uniformity objective function followed by an optimization procedure is proposed to optimize the multisine excitation signal. Performance comparison between the proposed multisine design and other alternative multisine design is carried out. It is demonstrated that the proposed phase-space uniform multisine enables better representation of the conversion error distribution compared with existing multisine designs. This results in a more accurate assessment of the analog-to-digital converter performance.
Year
DOI
Venue
2012
10.1109/TIM.2011.2169614
IEEE T. Instrumentation and Measurement
Keywords
Field
DocType
adc testing,analog-to-digital converter testing,analogue-digital conversion,excited states,phase-plane,testing,analog devices,analog-to-digital converter (adc),hybrid algorithm,optimization,multisine,multisine excitation signal,optimal phase-plane uniformity,phase space,vectors,phase plane,nonlinear distortion,genetic algorithm,device under test,genetic algorithms,objective function
Hybrid algorithm,Nonlinear system,Control theory,Control engineering,Excitation signal,Phase plane,Electronic engineering,Nonlinear distortion,Genetic algorithm,Mathematics
Journal
Volume
Issue
ISSN
61
3
0018-9456
Citations 
PageRank 
References 
4
0.55
12
Authors
4
Name
Order
Citations
PageRank
Meng Sang Ong1101.52
Ye Chow Kuang27219.81
Poon Shern Liam391.16
Melanie Po-Leen Ooi47018.35