| Signal-to-Noise Ratio Contributors and Effects in Proximal Near-Infrared Spectral Reflectance Measurement on Plant Leaves. | 0 | 0.34 | 2020 |
| Classifying Cannabis Sativa Flowers, Stems and Leaves using Statistical Machine Learning with Near-Infrared Hyperspectral Reflectance Imaging. | 0 | 0.34 | 2020 |
| Logic Built-In Self-Test Instrumentation System for Engineering Test Technology Education. | 0 | 0.34 | 2020 |
| Addressing Emerging Needs of Hi-Tech Industry: Collaborative Engineering Program in Electronic Testing, Instrumentation and Measurement | 1 | 0.48 | 2019 |
| Measurement uncertainty evaluation: Could it help to improve engineering design? | 0 | 0.34 | 2019 |
| Future trend in I&M: The smarter car | 0 | 0.34 | 2019 |
| Proximal Near-Infrared Spectral Reflectance Characterisation of Weeds Species in New Zealand Pasture. | 0 | 0.34 | 2019 |
| The fourth industrial revolution - Industry 4.0 and IoT [Trends in Future I&M]. | 2 | 0.40 | 2018 |
| Automated quantification of renal interstitial fibrosis for computer-aided diagnosis: A comprehensive tissue structure segmentation method. | 0 | 0.34 | 2018 |
| Application of moment-based measurement uncertainty evaluation to reliability analysis of structural systems | 0 | 0.34 | 2018 |
| Towards implementing uncertainty propagation in probabilistic floating-point computation error bounding | 0 | 0.34 | 2018 |
| The past and future of electronics testing [Trends in Future I&M]. | 0 | 0.34 | 2018 |
| Moment-Constrained Maximum Entropy Method for Expanded Uncertainty Evaluation. | 0 | 0.34 | 2018 |
| Measured Quantity Value Estimator for Multiplicative Nonlinear Measurement Models. | 0 | 0.34 | 2017 |
| Automatic renal interstitial fibrosis quantification system | 0 | 0.34 | 2017 |
| Among the challenges and future trends in I&M [Future Trends in I&M]. | 0 | 0.34 | 2016 |
| Automating Measurement Of Renal Interstitial Fibrosis: Effect Of Colour Spaces On Quantification | 0 | 0.34 | 2016 |
| Outstanding young engineer of the year award 2014 [Society News]. | 0 | 0.34 | 2016 |
| Moment-Based Measurement Uncertainty Evaluation For Reliability Analysis In Design Optimization | 0 | 0.34 | 2016 |
| Benchmark Test Distributions for Expanded Uncertainty Evaluation Algorithms. | 2 | 0.44 | 2016 |
| Multivariate alternating decision trees | 7 | 0.53 | 2016 |
| Performance comparison between expanded uncertainty evaluation algorithms | 1 | 0.37 | 2015 |
| Digital pathology: Identifying spongiosis in unstained histopathology specimen | 0 | 0.34 | 2015 |
| Sparse alternating decision tree | 1 | 0.36 | 2015 |
| Analytical Standard Uncertainty Evaluation Using Mellin Transform | 2 | 0.41 | 2015 |
| Vision inspection system for pharmaceuticals | 0 | 0.34 | 2014 |
| Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. | 0 | 0.34 | 2013 |
| Defect cluster recognition system for fabricated semiconductor wafers | 7 | 0.57 | 2013 |
| Multisine With Optimal Phase-Plane Uniformity for ADC Testing | 4 | 0.55 | 2012 |
| Statistical measures of two dimensional point set uniformity | 1 | 0.36 | 2012 |
| Performance Comparison of Various Multisine Excitation Signals in ADC Testing. | 1 | 0.47 | 2011 |
| Data-Driven Condition-Based Maintenance of Test Handlers in Semiconductor Manufacturing. | 0 | 0.34 | 2011 |
| Optimal Dual-Tone Frequency Selection for ADC Sine-Wave Tests | 5 | 0.62 | 2011 |
| Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction. | 2 | 0.41 | 2011 |
| Automatic Yield Management System for Semiconductor Production Test. | 0 | 0.34 | 2011 |
| Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers | 1 | 0.36 | 2010 |
| Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers | 2 | 0.47 | 2010 |
| Virtual Instrumentation Based IC Parametric Tester for Engineering Education | 0 | 0.34 | 2010 |
| Complex feature alternating decision tree | 4 | 0.43 | 2010 |
| Design of embedded differential equation solver | 0 | 0.34 | 2009 |
| Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices | 1 | 0.38 | 2008 |
| Shortening Burn-In Test: Application of HVST and Weibull Statistical Analysis | 7 | 0.84 | 2007 |
| Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space | 2 | 0.40 | 2006 |
| Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis | 17 | 1.07 | 2006 |
| Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST | 0 | 0.34 | 2005 |
