Paper Info
Title
On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors
Abstract
In software-based self-test (SBST) a microprocessor executes a set of test programs devised for detecting the highest possible percentage of faults. The main advantages of this approach are its high defect fault coverage (being performed at-speed) and the reduced cost (since it does not require any change in the processor hardware). SBST can also be used for on-line test of a microprocessor-based system. However, some additional constraints exist in this case (e.g. in terms of test length and duration, as well as intrusiveness). This paper faces the issue of automatically transforming a test set devised for manufacturing test in a test set suitable for on-line test. Experimental results are reported on an Intel 8051 microcontroller.
Year
DOI
Venue
2005
10.1109/DFTVS.2005.53
DFT
Keywords
Field
DocType
high defect fault coverage,highest possible percentage,test program,test length,main advantage,manufacturing test sets,processor hardware,additional constraint,on-line test sets,on-line test,microprocessor-based system,fault coverage
Test harness,System under test,Automatic test pattern generation,Fault coverage,Test Management Approach,Computer science,Automatic test equipment,Real-time computing,Test compression,Computer engineering,Test set,Embedded system
Conference
ISSN
ISBN
Citations 
1550-5774
0-7695-2464-8
14
PageRank 
References 
Authors
0.77
9
3
Name
Order
Citations
PageRank
E. Sanchez113016.50
M. Sonza Reorda21099114.76
G. Squillero333030.36