Title
Simulation And Modeling Of Substrate Noise Generation From Synchronous And Asynchronous Digital Logic Circuits
Abstract
An efficient methodology for simulating the substrate noise generated by complex synchronous and asynchronous digital logic circuits is presented. By simulating digital logic at the gate level, and precharacterizing the gates, the substrate noise generation can be predicted and used in a transistor level simulation of the sensitive analog blocks. This approach is shown to be accurate for both traditional CMOS logic and NULL Convention Logic (NCL) by correctly modeling critical gate characteristics. Simulations with different implementations of an 8051 processor core are in good agreement with measurements from a 0.25 mu m CMOS test chip.
Year
DOI
Venue
2007
10.1109/CICC.2007.4405860
PROCEEDINGS OF THE IEEE 2007 CUSTOM INTEGRATED CIRCUITS CONFERENCE
Keywords
Field
DocType
substrate noise, synchronous, asynchronous, null conventional logic, simulation
Digital electronics,Logic gate,Pass transistor logic,Computer science,Electronic engineering,Resistor–transistor logic,Logic simulation,Logic level,Logic family,Asynchronous circuit
Conference
Citations 
PageRank 
References 
1
0.35
9
Authors
4
Name
Order
Citations
PageRank
Christopher Hanken131.08
Jim Le231.08
Terri S. Fiez316747.25
Kartikeya Mayaram434958.50