Name
Abstract | ||
|---|---|---|
The detection of catastrophic short and open faults in bipolar current mode logic (CML) circuits is studied. The non-intrusive tests considered include functional (logic) tests, an Idd test, and a common-mode test. A 622 Mbps SONET SIPO (Serial-In/Parallel-Out) and a PISO (Parallel-In/Serial-Out) circuit form the basis of this case study. |
Year | DOI | Venue |
|---|---|---|
2000 | 10.1023/A:1008325420970 | J. Electronic Testing |
Keywords | Field | DocType |
current mode logic (CML),CML circuit testing,bipolar circuit testing,defect-based testing,catastrophic fault detection | Computer science,Fault detection and isolation,Electronic engineering,Real-time computing,Current-mode logic,Electronic circuit,Reliability engineering,Synchronous optical networking | Journal |
Volume | Issue | ISSN |
16 | 6 | 1573-0727 |
Citations | PageRank | References |
1 | 0.36 | 1 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| André Ivanov | 1 | 193 | 16.71 |
| Vikram Devdas | 2 | 1 | 0.36 |