Name
Abstract | ||
|---|---|---|
Localized delay defects, like resistive shorts, resistiveopens, etc., can be effectively detected by testing the longesttestable path through each wire (or gate) in the circuit. Sucha delay test set is referred to as a longest-path-per-wire testset. ... |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1109/VTEST.2003.1197664 | VTS |
Keywords | Field | DocType |
localized delay defect,longesttestable path,resistive short,sucha delay test set,longest-path-per-wire testset,energy consumption ratio test,fault coverage,vlsi,leakage current,process variation,statistical analysis,design for testability,test methods,data analysis | Design for testing,Fault coverage,Leakage (electronics),Computer science,Electronic engineering,Process variation,Electronic circuit,Very-large-scale integration,Energy consumption,Ratio test,Reliability engineering | Conference |
ISSN | ISBN | Citations |
1093-0167 | 0-7695-1924-5 | 0 |
PageRank | References | Authors |
0.34 | 12 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xiaoyun Sun | 1 | 14 | 2.13 |
| Larry L. Kinney | 2 | 60 | 21.14 |
| Bapiraju Vinnakota | 3 | 237 | 25.36 |