Name
Abstract | ||
|---|---|---|
We describe a test generation system for synchronous sequential circuits described at the gate level. The test generation system, called MIX, combines several test generation approaches to derive test sequences exhibiting very high fault coverages at relatively low CPU times. It is known that different faults in a synchronous sequential circuit may be more amenable to different test generation approaches. The strength of MIX stems from the fact that a large number of different approaches is used to attack faults with different characteristics. Several new techniques are incorporated into MIX, including a new definition of an XD-frontier, storing a partial state transition graph to help in the derivation of justification sequences, utilization of sequences generated for aborted faults, consideration of multiple time frames simultaneously during state justification, and dynamic computation of dependencies among flip-flops. A simplified form of test generation under the restricted multiple observation times test strategy is also employed, based on state expansion. Restricted multiple observation times fault simulation is used in MIX to identify detected faults beyond those detected by conventional fault simulation. |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1109/ICVD.1998.646649 | VLSI Design |
Keywords | Field | DocType |
test generation system,different characteristic,test generation approach,test generation,different test generation approach,restricted multiple observation time,different approach,synchronous sequential circuit,synchronous sequential circuits,different fault,test strategy,sequential circuits,fault detection,computational modeling,central processing unit,system testing,fault coverage,sequential analysis | Automatic test pattern generation,Graph,Sequential logic,Fault coverage,Computer science,Logic testing,Algorithm,Real-time computing,Electronic engineering,Test strategy,Computation | Conference |
ISBN | Citations | PageRank |
0-8186-8224-8 | 22 | 1.09 |
References | Authors | |
32 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xijiang Lin | 1 | 687 | 42.03 |
| Irith Pomeranz | 2 | 3829 | 336.84 |
| Sudhakar M. Reddy | 3 | 5747 | 699.51 |