Name
Title | ||
|---|---|---|
Novel Built-In Current-Sensor-Based IDDQ Testing Scheme for CMOS Integrated Circuits. |
Year | Venue | DocType |
|---|---|---|
2009 | IEEE T. Instrumentation and Measurement | Journal |
Volume | Issue | Citations |
58 | 7 | 0 |
PageRank | References | Authors |
0.34 | 0 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Chun-Lung Hsu | 1 | 59 | 14.53 |
| Mean-Hom Ho | 2 | 3 | 1.52 |
| Chin-Feng Lin | 3 | 129 | 15.35 |