Name
Abstract | ||
|---|---|---|
A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-detect faults are easily detected. This is done by taking advantage of the information available when a target fault is aborted by the test generator. A partial scan selection tool, IDROPS, has been developed which selects the best and smallest set of flip-flops to scan that will result in a high fault coverage. Results indicate that high fault coverage in hard-to-test circuits can be achieved using fewer scan flip-flops than in previous methods. |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1109/ICVD.1998.646598 | VLSI Design |
Keywords | Field | DocType |
hard-to-test circuit,selection tool,dynamic reachability,observability measure,smallest set,high fault coverage,selection strategy,partial scan selection,observability information,previous method,remaining hard-to-detect fault,target fault,fault coverage,dft,sequential circuits,fault detection,chip,reliability engineering,observability | Partial scan,Observability,Sequential logic,Fault coverage,Computer science,Fault detection and isolation,Scan chain,Reachability,Real-time computing,Electronic engineering,Electronic circuit | Conference |
ISBN | Citations | PageRank |
0-8186-8224-8 | 18 | 0.68 |
References | Authors | |
20 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Michael S. Hsiao | 1 | 1467 | 132.13 |
| Gurjeet S. Saund | 2 | 28 | 1.26 |
| Elizabeth M. Rudnick | 3 | 867 | 76.37 |
| J. H. Patel | 4 | 4577 | 527.59 |