Abstract | ||
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This paper describes algorithms for generating a low-distortion single-tone signal, for testing ADCs, using an arbitrary waveform generator (AWG). The AWG consists of DSP (or waveform memory) and DAC, and the nonlinearity of the DAC generates distortion components. We propose here to use DSP algorithms to precompensate for the distortion. The DSP part of the AWG can interleave multiple signals with the same frequency but different phases at the input to the DAC, in order to precompensate for distortion caused by DAC nonlinearity. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of this approach. |
Year | DOI | Venue |
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2012 | 10.1007/s10836-012-5293-4 | J. Electronic Testing |
Keywords | Field | DocType |
ADC testing,Arbitrary waveform generator,Digital pre-distortion,Sinusoidal signal,Distortion shaping | Flight dynamics (spacecraft),Integral nonlinearity,Digital signal processing,Nonlinear system,Computer science,Waveform,Electronic engineering,Arbitrary waveform generator,Distortion,Sine wave | Journal |
Volume | Issue | ISSN |
28 | 5 | 0923-8174 |
Citations | PageRank | References |
8 | 1.45 | 3 |
Authors | ||
7 |
Name | Order | Citations | PageRank |
---|---|---|---|
Kazuyuki Wakabayashi | 1 | 15 | 2.76 |
Keisuke Kato | 2 | 15 | 2.76 |
Takafumi Yamada | 3 | 15 | 2.76 |
Osamu Kobayashi | 4 | 18 | 4.56 |
Haruo Kobayashi | 5 | 27 | 7.46 |
Fumitaka Abe | 6 | 15 | 2.76 |
Kiichi Niitsu | 7 | 126 | 38.14 |