Title
Low-Power Dual-Edge Triggered State Retention Scan Flip-Flop
Abstract
This work presents a low-power dual-edge triggered static scanable flip-flop that uses reduced swing-clock and -data to manage dynamic power. The circuit employs clock- and power-gating during idle mode to eliminate dynamic power and reduce static power, while retaining circuit’s state. The static structure of the circuit makes it feasible to be employed in variable frequency power control designs. HSPICE post-layout simulation conducted for 90nm CMOS technology showed that in terms of power-delay product, device count, and leakage power the proposed design is comparable to other high performance static flip-flops.
Year
DOI
Venue
2009
10.1007/978-3-642-11802-9_20
Workshop on Power and Timing Modeling, Optimization and Simulation
Keywords
Field
DocType
static structure,static power,low-power flip-flop,device count,static flip-flop,variable frequency power control,test.,leakage power,state retention,hspice post-layout simulation,static scanable flip-flop,dynamic power,cmos technology,low-power dual-edge,power control,test
Computer science,Idle,Power control,Volt-ampere,Power factor,Real-time computing,CMOS,Electronic engineering,Dynamic demand,Flip-flop,Switched-mode power supply
Conference
Volume
ISSN
ISBN
5953
0302-9743
3-642-11801-1
Citations 
PageRank 
References 
0
0.34
13
Authors
3
Name
Order
Citations
PageRank
Hossein Karimiyan Alidash121.43
Sayed Masoud Sayedi2479.88
Hossein Saidi313120.73