Name
Title | ||
|---|---|---|
Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction |
Abstract | ||
|---|---|---|
In this paper, we propose new techniques for finding Xs in test sequences for sequential circuits. Also we show two applications that utilize the obtained test sequences with Xs: reduction of the power during test and test compaction. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/ATS.2004.80 | Asian Test Symposium |
Keywords | Field | DocType |
sequential circuits,sequential circuit,test compaction,test sequences,test length,power reduction,new technique,test sequence,automatic test pattern generation | Automatic test pattern generation,Sequential logic,Fault coverage,Computer science,Test compaction,Algorithm,Real-time computing,Electronic engineering,Test compression,Power consumption | Conference |
ISSN | ISBN | Citations |
1081-7735 | 0-7695-2235-1 | 1 |
PageRank | References | Authors |
0.35 | 3 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yoshinobu Higami | 1 | 140 | 27.24 |
| Seiji Kajihara | 2 | 989 | 73.60 |
| Sin-ya Kobayashi | 3 | 1 | 0.69 |
| Yuzo Takamatsu | 4 | 150 | 27.40 |