| Ff-Control Point Insertion (Ff-Cpi) To Overcome The Degradation Of Fault Detection Under Multi-Cycle Test For Post | 0 | 0.34 | 2020 |
| Automotive Functional Safety Assurance by POST with Sequential Observation. | 1 | 0.38 | 2018 |
| Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST | 0 | 0.34 | 2018 |
| Evaluation of educational applications in terms of communication delay between tablets with Bluetooth or Wi-Fi Direct. | 0 | 0.34 | 2018 |
| Trip-Based Integer Linear Programming Model For Static Multi-Car Elevator Operation Problems | 0 | 0.34 | 2017 |
| On selection of adjacent lines in test pattern generation for delay faults considering crosstalk effects | 0 | 0.34 | 2017 |
| A Method For Diagnosing Bridging Fault Between A Gate Signal Line And A Clock Line | 0 | 0.34 | 2017 |
| Discrimination Of A Resistive Open Using Anomaly Detection Of Delay Variation Induced By Transitions On Adjacent Lines | 0 | 0.34 | 2017 |
| Testing of Interconnect Defects in Memory Based Reconfigurable Logic Device (MRLD) | 2 | 0.39 | 2017 |
| Harnessing Fuzziness of the Pragmatic Rule-Design Without IF-THEN Rules. | 0 | 0.34 | 2017 |
| Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation | 2 | 0.41 | 2016 |
| Evaluation of Influence Exerted by a Malicious Group's Various Aims in the External Grid. | 0 | 0.34 | 2016 |
| Diagnosis Methods for Gate Delay Faults with Various Amounts of Delays. | 0 | 0.34 | 2016 |
| Design And Implementation Of Data Synchronization And Offline Capabilities In Native Mobile Apps | 0 | 0.34 | 2016 |
| Giving formal roles to elevators for breaking symmetry in static elevator operation problems | 0 | 0.34 | 2015 |
| Diagnosis of Delay Faults Considering Hazards | 0 | 0.34 | 2015 |
| Sushi: A Lightweight Distributed Image Storage System for Mobile and Web Services | 0 | 0.34 | 2014 |
| Optimal Periods for Probing Convergence of Infinite-stage Dynamic Programmings on GPUs. | 0 | 0.34 | 2014 |
| Test Generation For Delay Faults On Clock Lines Under Launch-On-Capture Test Environment | 0 | 0.34 | 2013 |
| Intermittently Proving Dynamic Programming to Solve Infinite MDPs on GPUs | 0 | 0.34 | 2013 |
| Generation Of Diagnostic Tests For Transition Faults Using A Stuck-At Atpg Tool | 1 | 0.36 | 2012 |
| Dynamic Routing and Wavelength Assignment with Backward Reservation in Wavelength-routed Multifiber WDM Networks. | 1 | 0.36 | 2012 |
| Diagnosis for Bridging Faults on Clock Lines | 0 | 0.34 | 2012 |
| Fault simulation and test generation for clock delay faults | 10 | 1.05 | 2011 |
| On Detecting Transition Faults in the Presence of Clock Delay Faults | 2 | 0.38 | 2011 |
| Test Pattern Selection for Defect-Aware Test | 0 | 0.34 | 2011 |
| Enhancement of Clock Delay Faults Testing | 2 | 0.46 | 2011 |
| Replica Selection and Downloading based on Wavelength Availability in λ-grid Networks. | 1 | 0.36 | 2010 |
| Dynamic Parallel Downloading with Network Coding in $\lambda$-Grid Networks. | 1 | 0.35 | 2010 |
| New Class of Tests for Open Faults with Considering Adjacent Lines | 2 | 0.38 | 2009 |
| Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC | 5 | 0.50 | 2009 |
| Addressing Defect Coverage Through Generating Test Vectors For Transistor Defects | 0 | 0.34 | 2009 |
| A Novel Approach for Improving the Quality of Open Fault Diagnosis | 5 | 0.49 | 2009 |
| An Algorithm for Diagnosing Transistor Shorts Using Gate-level Simulation. | 0 | 0.34 | 2009 |
| Diagnostic Test Generation For Transition Faults Using A Stuck-At Atpg Tool | 13 | 0.66 | 2009 |
| Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools | 1 | 0.37 | 2008 |
| Maximizing Stuck-Open Fault Coverage Using Stuck-At Test Vectors | 2 | 0.40 | 2008 |
| Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information | 1 | 0.36 | 2008 |
| Post-BIST Fault Diagnosis for Multiple Faults | 0 | 0.34 | 2008 |
| Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults | 7 | 0.64 | 2008 |
| Timing-Aware Diagnosis for Small Delay Defects | 4 | 0.45 | 2007 |
| Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines | 5 | 0.49 | 2007 |
| Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation | 1 | 0.37 | 2007 |
| Effective Post-BIST Fault Diagnosis for Multiple Faults | 1 | 0.39 | 2006 |
| On Finding Don't Cares in Test Sequences for Sequential Circuits | 4 | 0.47 | 2006 |
| Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits | 9 | 0.74 | 2006 |
| Test cost reduction for logic circuits: Reduction of test data volume and test application time | 3 | 0.45 | 2005 |
| Failure analysis of open faults by using detecting/un-detecting information on tests | 3 | 0.43 | 2004 |
| Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction | 1 | 0.35 | 2004 |
| Generation Of Test Sequences With Low Power Dissipation For Sequential Circuits | 0 | 0.34 | 2004 |
