Title
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays
Abstract
The test of Field Programmable Analog Arrays (FPAA) may be performed based on partitioning these devices in three main parts: I/O cells, interconnection networks and configurable analog blocks. In this work, a scheme for testing the I/O cells and the local and global interconnection networks of FPAAs is proposed, using an adjacency graph model to represent the programmable interconnection and I/O resources, and then devising a set of test configurations (TC) by solving graph coloring problems. The goal is to achieve a near minimum number of TCs ensuring all stuck-open and stuck-on faults in switches, as well as opens and shorts in wires, are covered. Large parametric faults in interconnects are implicitly covered in these TCs by judiciously choosing test stimuli and, in I/O buffers, by means of an Oscillation-based Test Strategy.
Year
DOI
Venue
2005
10.1109/VTS.2005.85
VTS
Keywords
Field
DocType
programmable interconnection,o resources,adjacency graph model,interconnection network,interconnect networks,test configuration,o cell,o resource,o buffer,field programmable analog arrays,test stimulus,global interconnection network,analog circuits,field programmable analog array,graph coloring problem,switches,oscillations
Adjacency list,Computer science,Electronic engineering,Input/output,Parametric statistics,Field-programmable analog array,Interconnection,Test strategy,Graph model,Graph coloring
Conference
ISSN
ISBN
Citations 
1093-0167
0-7695-2314-5
7
PageRank 
References 
Authors
0.75
4
6
Name
Order
Citations
PageRank
Gustavo Pereira170.75
Antonio Andrade Jr.2242.58
Tiago R. Balen35312.21
Marcelo Lubaszewski448347.66
Florence Azaïs5466.58
Michel Renovell674996.46