Name
Year | DOI | Venue |
|---|---|---|
1994 | 10.1109/DFTVS.1994.630020 | DFT |
Keywords | Field | DocType |
large area vlsi systems,defect correction,laser processes,fault tolerant,circuits,redundancy,chip,signal processing,transducers,substitution,very large scale integration,fault tolerance,error correction,testing | Wafer,Computer science,Error detection and correction,Laser,Chip,Electronic engineering,Fault tolerance,Very-large-scale integration,Fabrication,Wafer-scale integration | Conference |
ISBN | Citations | PageRank |
0-8186-6307-3 | 0 | 0.34 |
References | Authors | |
2 | 1 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Glenn H. Chapman | 1 | 167 | 34.10 |